Focused Ion Beam (FIB) systems have primarily been used by large manufacturers of semiconductors for defect analysis, wafer modification and repair. Newer FIB systems are now being introduced that have high resolution imaging capabilities replacing scanning electron microscopes.
To achieve the high resolution electron imaging system design multiple programmable power supplies are required for which TDK-Lambda suggested the Z+ programmable power supply series. A 2U rack enclosure was selected, containing four 200W 0-60V, 0-3.5A power supplies. Despite heavy competition, the proven reliability of the Z+ and technical support provided by TDK-Lambda were decisive factors for selection.
TDK-Lambda offers a wide range of Programmable Power Supplies for industrial, test and measurement applications, click for more information