Application Solutions

Power Supplies for Scanning Electron Microscopes

Posted by Dulcie on November 17, 2016

A Scanning Electron Microscope (SEM) does not use a traditional light and lens to magnify the sample under inspection, but produces an image by scanning it with a focused beam of electrons. This produces an extremely high resolution image. For high throughput, multiple samples can be loaded, even when high pressure or low vacuum modes are required.

TDK-Lambda’s 48V 600W HWS power supplies are being used on the latest generation of SEMs. The “PV” option was chosen which allows the output voltage to be programmed over a wide 9.6 to 52V range by a 1-6V external signal. As acoustical noise can cause operator fatigue, the low noise fan (LNF) option was also incorporated in the power supply. This model is also covered by a TDK-Lambda’s limited lifetime warranty.

TDK-Lambda offers a wide range of Industrial Power Supplies for industrial, test and measurement applications, click for more information.