Application Solutions
Test & Measurement
12
Oct

Testing semiconductors

Posted by Dulcie on October 12, 2016
Z plus 500 125

Semiconductor testing is often performed at a wafer level to determine yield levels; after which, the wafers may be stored prior to packaging in order to meet quick delivery demands.

As space in a semiconductor clean room is limited and usually at a premium, overall test equipment size is a concern. One European semiconductor company chose the 800W TDK-Lambda’s Z+ model for its compact size, being just 2U high and 70mm wide. The entire Z+ series has, as standard, a number of communication and programming interfaces, including USB, RS232 & RS485.

TDK-Lambda offers a wide range of Programmable Power Supplies for industrial, test and measurement applications, click for more information.

www.emea.lambda.tdk.com/uk/zplus