Testing semiconductors
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Semiconductor testing is often performed at a wafer level to determine yield levels; after which, the wafers may be stored prior to packaging in order to meet quick delivery demands.
As space in a semiconductor clean room is limited and usually at a premium, overall test equipment size is a concern. One European semiconductor company chose the 800W TDK-Lambda’s Z+ model for its compact size, being just 2U high and 70mm wide. The entire Z+ series has, as standard, a number of communication and programming interfaces, including USB, RS232 & RS485.
TDK-Lambda offers a wide range of Programmable Power Supplies for industrial, test and measurement applications, click for more information.